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SEM Instrumentation
Chamberscopes, Peltier stages, stage automation & beam blanking for SEM applications
SEM Chamberscope

Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination.

SEM Coolstages

Deben Coolstages are available for all Scanning Electron Microscopes

Tabletop SEM Accessories

A full range of accessories are available for a wide range of SEM tabletop microscopes

Beam Blanking with PCD

The Deben PCD beam blanker is available for most JEOL and Hitachi SEMs

Feedthrough Flanges

We have many different electrical feedthroughs available.

Forensic Comparison Stage

The comparison stage is designed to accept the most common bullets and cartridge cases

SEM Probe Current Meter

A low-cost 3½-digit liquid crystal display readout of Electron Beam Probe Current.

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