Atomic Force Microscopy

In-Situ Solutions for Atomic Force Microscopy (AFM)

Deben’s in-situ accessories are engineered to integrate seamlessly with your AFM, providing a stable platform for high-resolution imaging while simultaneously subjecting your sample to tensile, compressive, or thermal stress.

Our specialised stages allow you to correlate mechanical or environmental changes directly with topographical shifts at the atomic scale. Whether you are studying the phase transition of thin films, the elastic modulus of polymers, or the adhesion of biological membranes, Deben provides the sub-nanometer stability and precise control necessary for reliable, publication-quality data.

Why choose Deben for AFM?

• Nanoscale stability: Designed to minimise drift for high-resolution imaging.

• Environmental control: Perform experiments under variable temperature and stress.

• Seamless integration: Compact designs compatible with major AFM manufacturers.