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SEM PCD Fast Beam Blanking
The Deben PCD beam blanker is available for most JEOL and Hitachi SEMs. Applications include EBIC, CL, voltage contrast, electron beam writing and lithography, electron acoustic microscopy and X-ray analysis.
SEM Beam Blanking JEOL & Hitachi SEMs
The Deben PCD Beam Blanker has been designed to provide JEOL and Hitachi FEG, LaB6 and tungsten SEMs with the capability of blanking, pulsing or otherwise modulating the electron beam.
