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SEM Instrumentation
Chamberscopes, Peltier stages, stage automation & beam blanking for SEM applications
SEM chamberscope

Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination.

SEM peltier stage system for in-situ heating & cooling

Deben Coolstages are available for all Scanning Electron Microscopes

SEM & TEM stage Automation

SPRITE stage automation systems are available for all makes and models of electron microscope.

Accessories for Tabletop SEMs

A full range of accessories are available for a wide range of SEM tabletop microscopes

Beam Blanking for SEMs

The Deben PCD beam blanker is available for most JEOL and Hitachi SEMs

SEM vacuum electrical feedthrough flanges

We have many different electrical feedthroughs available.

Ballistic comparison stage

The comparison stage is designed to accept the most common bullets and cartridge cases

JEOL SEM Motorised objective aperture holder

Deben can offer a motorised aperture drive for many SEM columns.

SEM Probe Current Meter

A low-cost 3½-digit liquid crystal display readout of Electron Beam Probe Current.

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